Method of carrier profiling in semiconductors

Method of carrier profiling in semiconductors

Patent ID: US-10401382-B2
Published: September 2019
Category: Electronics & Technology

Abstract

The superimposition of a periodic potential wave to the tip movement control or the bias supply of an STM, in which a microwave frequency comb is generated in its tunneling junction, may be used to reduce or eliminate artifacts or other noise generated from outside the tunneling junction.

Patent Details

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